collisional ionization meaning in Chinese

碰撞电离

A new model for the growth stage of surface flashover has been developed according to the experimental results , which is based on the solid band theory . it is suggested that the electron multiplication could be attributed to two processes : one is the secondary electron emission avalanche caused by collisional ionization , the other is the micro - discharge caused by the trap centers of insulator . the trap cente
电子倍增的过程与材料的表面态直接相关，材料微观结构的变化和材料的表面处理都能够导致材料表面态的变化，引起材料的表面二次电子发射系数以及材料中陷阶密度和分布的改变，从而影响了电子倍增的过程，并进一步改变或影响了沿面闪络的发展过程。